Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation

Author: Mattes Heinz  

Publisher: Springer Publishing Company

ISSN: 0923-8174

Source: Journal of Electronic Testing, Vol.22, Iss.4-6, 2006-12, pp. : 337-350

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract