Author: Mattes Heinz
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.22, Iss.4-6, 2006-12, pp. : 337-350
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Modeling of channel mismatch in time-interleaved SAR ADC
By Dengquan Li Liang Zhang Zhangming Zhu Yintang Yang
Journal of Semiconductors, Vol. 36, Iss. 9, 2015-09 ,pp. :
Next generation knowledge management
By Davies J. Studer R. Sure Y. Warren P.
BT Technology Journal, Vol. 23, Iss. 3, 2005-07 ,pp. :
The next-generation ARC middleware
By Appleton O.
annals of telecommunications - annales des télécommunications, Vol. 65, Iss. 11-12, 2010-12 ,pp. :