Author: Reddy Kiran
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.26, Iss.3, 2010-06, pp. : 323-335
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
On-Line Error Detection for Bit-Serial Multipliers in GF(2m)
By Fenn S.
Journal of Electronic Testing, Vol. 13, Iss. 1, 1998-08 ,pp. :
Journal of Electronic Testing, Vol. 20, Iss. 5, 2004-10 ,pp. :