How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002

Author： Joshi Y.   Azar K.   Blackburn D.   Lasance C.J.M.   Mahajan R.   Rantala J.  

Publisher： Elsevier

ISSN： 0026-2692

Source： Microelectronics, Vol.34, Iss.12, 2003-12, pp. : 1195-1201

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