Spectroscopic ellipsometry of intentionally disordered superlattices

Author： Dominguez-Adame F.   Hey R.   Bellani V.   Parravicini G.B.   Diez E.  

Publisher： Elsevier

ISSN： 0026-2692

Source： Microelectronics, Vol.35, Iss.1, 2004-01, pp. : 59-61

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Characterization of organic thin films for OLEDs using spectroscopic ellipsometry

By Celii Francis   Harton Tracy   Phillips O.Faye  

Journal of Electronic Materials, Vol. 26, Iss. 4, 1997-04 ,pp. : 366-371

Springer Publishing Company

Access to resources Recommend Favorite

Low-k dielectrics: a non-destructive characterization by infrared spectroscopic ellipsometry

By Boher P.   Defranoux C.   Bucchia M.   Guillotin C.  

Microelectronic Engineering, Vol. 70, Iss. 2, 2003-11 ,pp. : 320-329

Elsevier

Access to resources Recommend Favorite

Fast Detection of Precipitates and Oxides on CdZnTe Surfaces by Spectroscopic Ellipsometry

By Badano G.   Million A.   Canava B.   Tran-Van P.   Etcheberry A.  

Journal of Electronic Materials, Vol. 36, Iss. 8, 2007-08 ,pp. : 1077-1084

Springer Publishing Company

Access to resources Recommend Favorite

Optical constants of Bi 2 Te 3 and Sb 2 Te 3 measured using spectroscopic ellipsometry

By Cui Hao   Bhat I.   Venkatasubramanian R.  

Journal of Electronic Materials, Vol. 28, Iss. 10, 1999-10 ,pp. : 1111-1114

Springer Publishing Company

Access to resources Recommend Favorite

Spectroscopic ellipsometry for monitoring and control of molecular beam epitaxially grown HgCdTe heterostructures

By Bevan M.   Almeida L.   Duncan W.   Shih H.  

Journal of Electronic Materials, Vol. 26, Iss. 6, 1997-06 ,pp. : 502-506

Springer Publishing Company

Access to resources Recommend Favorite