Spectroscopic ellipsometry for monitoring and control of molecular beam epitaxially grown HgCdTe heterostructures

Author: Bevan M.   Almeida L.   Duncan W.   Shih H.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.26, Iss.6, 1997-06, pp. : 502-506

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