Author： Nirschl T. Ostermayr M. Olbrich A. Vietzke D. Omer M. Linnenbank C. Schaper U. Pottgiesser Y. Pottgiesser J. Johansson M. Simon U. Joens A.
Publisher： Elsevier
ISSN： 0026-2714
Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1383-1387
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