Microelectronics Reliability,volume 43,issue 9  (09-2004)

Period of time: 2004年9期

Publisher: Elsevier

Founded in: 1962

Total resources: 4

ISSN: 0026-2714

Subject: TN Radio Electronics, Telecommunications Technology

Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Microelectronics Reliability,volume 43,issue 9

Menu

Editorial

By Labat N., Touboul A. in (2003)

Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp. 1351-1352

Elsevier

Abstract Access to resources Recommend Favorite

Reliability of ultra-thin oxides in CMOS circuits

By Stathis J.H., Linder B.P., Rodriguez R., Lombardo S. in (2003)

Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp. 1353-1360

Elsevier

Abstract Access to resources Recommend Favorite

MALTY--A memory test structure for analysis in the early phase of the technology development

By Nirschl T., Ostermayr M., Olbrich A., Vietzke D., Omer M., Linnenbank C., Schaper U., Pottgiesser Y., Pottgiesser J., Johansson M., Simon U., Joens A. in (2003)

Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp. 1383-1387

Elsevier

Abstract Access to resources Recommend Favorite

The right way to assess electronic system reliability: FIDES

By Charpenel P., Davenel F., Digout R., Giraudeau M., Glade M., Guerveno J., Guillet N., Lauriac A., Male S., Manteigas D., Meister R., Moreau E., Perie D., Relmy-Madinska F., Retailleau P. in (2003)

Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp. 1401-1404

Elsevier

Abstract Access to resources Recommend Favorite