Period of time: 2004年9期
Publisher: Elsevier
Founded in: 1962
Total resources: 4
ISSN: 0026-2714
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Microelectronics Reliability,volume 43,issue 9
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By Labat N., Touboul A. in (2003)
Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp.Reliability of ultra-thin oxides in CMOS circuits
By Stathis J.H., Linder B.P., Rodriguez R., Lombardo S. in (2003)
Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp.By Dufourt D., Pelloie J.L. in (2003)
Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp.By Andreini A., Neva C., Renard L., Sironi G., Speroni F., Sponton L., Tampellini F., Tiziani R. in (2003)
Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp.MALTY--A memory test structure for analysis in the early phase of the technology development
By Nirschl T., Ostermayr M., Olbrich A., Vietzke D., Omer M., Linnenbank C., Schaper U., Pottgiesser Y., Pottgiesser J., Johansson M., Simon U., Joens A. in (2003)
Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp.Correlation of gate oxide reliability and product tests on leading edge DRAM technology
Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp.The right way to assess electronic system reliability: FIDES
By Charpenel P., Davenel F., Digout R., Giraudeau M., Glade M., Guerveno J., Guillet N., Lauriac A., Male S., Manteigas D., Meister R., Moreau E., Perie D., Relmy-Madinska F., Retailleau P. in (2003)
Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp.By Song Y.-H., Kim S.G., Lee S.B., Rhee K.J., Kim T.S. in (2003)
Microelectronics Reliability,volume 43,issue 9 , Vol. 43, Iss. 9, 2003-09 , pp.