Reliability of optoelectronics components: towards new qualification practices

Author： Goudard J.L.   Boddaert X.   Perinet J.   Laffitte D.  

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1767-1769

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