Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.

Author: Soussan P.   Lekens G.   Dreesen R.   De Ceuninck W.   Beyne E.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1785-1790

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Abstract