Ferroelectric properties of Pb(Zr,Ti)O 3 heterolayered thin films for FRAM applications

Author: Kim K.-T.   Kim C.-I.   Lee S.-G.  

Publisher: Elsevier

ISSN: 0167-9317

Source: Microelectronic Engineering, Vol.66, Iss.1, 2003-04, pp. : 662-669

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Abstract