Reliability assessment of indium tin oxide thin films by accelerated degradation test

By Kim Yong-Nam   Jeong Seong-Min   Jeon Min-Seok   Shin Hyun-Gyoo   Song Jun-Kwang   Lee Hee-Soo  

Journal of Electroceramics, Vol. 17, Iss. 2-4, 2006-12 ,pp. : 955-958

Springer Publishing Company

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Annealing and Microstructural Characterization of Tin-Oxide Based Thick Film Resistors

By Rahman K.M.A.  

Journal of Electroceramics, Vol. 9, Iss. 2, 2002-11 ,pp. : 137-150

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Deposition and gas sensing properties of tin oxide thin films by inductively coupled plasma chemical vapor deposition

By Lee Y.   Tan O.   Huang H.   Tse M.  

Journal of Electroceramics, Vol. 16, Iss. 4, 2006-07 ,pp. : 507-509

Springer Publishing Company

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Characterization of Partial Discharges in a Gas Insulated System Using an Acoustic Emission Technique

By Sarathi R.   Dubey Vishal   Srinivasa Y.  

Electric Power Components and Systems, Vol. 34, Iss. 6, 2006-06 ,pp. : 653-669

Taylor & Francis Ltd

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Tin Oxide Thin Films Grown on the (\bar{1}012) Sapphire Substrate

By Pan X.Q.   Fu L.  

Journal of Electroceramics, Vol. 7, Iss. 1, 2001-10 ,pp. : 35-46

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