Reliability assessment of indium tin oxide thin films by accelerated degradation test

Author： Kim Yong-Nam Jeong Seong-Min Jeon Min-Seok Shin Hyun-Gyoo Song Jun-Kwang Lee Hee-Soo

ISSN： 1385-3449

Source： Journal of Electroceramics, Vol.17, Iss.2-4, 2006-12, pp. : 955-958

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