Author: Mitchel W. Evwaeaye A. Smith S. Roth M.
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.26, Iss.3, 1997-03, pp. : 113-118
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Influence of N-type doping on the oxidation rate in n-type 6H-SiC
Journal of Semiconductors, Vol. 36, Iss. 1, 2015-01 ,pp. :
By Zeng Jian-Jhou Ruan Cheng-He Lin Jian-Huang Lin Yow-Jon
Semiconductor Science and Technology, Vol. 28, Iss. 6, 2013-06 ,pp. :