An EPR study of defects induced in 6H-SiC by ion implantation

Author: Barklie R.   Collins M.   Holm B.   Pacaud Y.   Skorupa W.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.26, Iss.3, 1997-03, pp. : 137-143

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract