Effects of aluminum sputtering process parameters on via step coverage in micro-electronic device manufacturing

Author: Depinto G.   Dunnigan S.   Schwechel K.   Mishra B.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.26, Iss.4, 1997-04, pp. : 376-382

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Abstract