Author: Youtsey C. Bulman G. Adesida I.
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.27, Iss.4, 1998-04, pp. : 282-287
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Iron nitride mask and reactive ion etching of GaN films
Journal of Electronic Materials, Vol. 27, Iss. 4, 1998-04 ,pp. :
A photoluminescence study of plasma reactive ion etching-induced damage in GaN
Journal of Semiconductors, Vol. 35, Iss. 11, 2014-11 ,pp. :