Proximal probe characterization of nanoscale charge transport properties in Co/SiO 2 multilayer structures

Author： Schaadt D.   Yu E.   Sankar S.   Berkowitz A.  

Publisher： Springer Publishing Company

ISSN： 1543-186X

Source： Journal of Electronic Materials, Vol.29, Iss.11, 2000-11, pp. : 1299-1303

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