Electrical characterization of fast transient phenomena in a Si-rich based non-volatile random access memory

Author: Deleruyelle D.   Cluzel J.   De Salvo B.   Fraboulet D.   Mariolle D.   Buffet N.   Deleonibus S.  

Publisher: Elsevier

ISSN: 0038-1101

Source: Solid-State Electronics, Vol.47, Iss.10, 2003-10, pp. : 1641-1644

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