Performance of 850 nm AlGaAs/GaAs implanted VCSELs utilizing silicon implantation induced disordering

Author: Lai F.-I.   Hsueh T.-H.   Chang Y.-h.   Shu W.-c.   Lai L.-H.   Kuo H.C.   Wang S.C.  

Publisher: Elsevier

ISSN: 0038-1101

Source: Solid-State Electronics, Vol.47, Iss.10, 2003-10, pp. : 1805-1809

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Abstract