Er 3+ -doped tellurite waveguides deposited by excimer laser ablation

By Caricato A.P.   Fernandez M.   Ferrari M.   Leggieri G.   Martino M.   Mattarelli M.   Montagna M.   Resta V.   Zampedri L.   Almeida R.M.   Concalves M.C.   Fortes L.   Santos L.F.  

Materials Science and Engineering: B, Vol. 105, Iss. 1, 2003-12 ,pp. : 64-68

Elsevier

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Spectroscopic characterization of Er-1 center in selectively doped silicon

By Vinh N.Q.   Klik M.   Andreev B.A.   Gregorkiewicz T.  

Materials Science and Engineering: B, Vol. 105, Iss. 1, 2003-12 ,pp. : 150-152

Elsevier

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Microstructure and emission properties of Si nanograins and Er-doped silica films obtained by reactive magnetron co-sputtering

By Singh P.   Gourbilleau F.   Dufour C.   Levalois M.   Vicens J.   Rizk R.   Pellegrino P.   Garcia C.   Tomas R.F.i.   Garrido B.  

Materials Science and Engineering: B, Vol. 105, Iss. 1, 2003-12 ,pp. : 220-224

Elsevier

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FTIR and XPS investigation of Er-doped SiO 2 -TiO 2 films

By Fang Q.   Meier M.   Yu J.J.   Wang Z.M.   Zhang J.-Y.   Wu J.X.   Kenyon A.   Hoffmann P.   Boyd I.W.  

Materials Science and Engineering: B, Vol. 105, Iss. 1, 2003-12 ,pp. : 208-212

Elsevier

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A simple approach for upconversion determination using low excitation power: the photoluminescence analysis of an Er-doped aluminosilicate glass

By Enrichi F.   Borsella E.  

Materials Science and Engineering: B, Vol. 105, Iss. 1, 2003-12 ,pp. : 19-23

Elsevier

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