Analysis of GaN epilayers on sapphire substrates with GaN and AlN sublayers

Author: Drozdov Yu.   Drozdov M.   Khrykin O.   Shashkin V.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1027-4510

Source: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol.4, Iss.6, 2010-11, pp. : 998-1001

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Abstract