Author: Kladko V. Kuchuk A. Safriuk N. Machulin V. Belyaev A. Konakova R. Yavich B. Ber B. Kazantsev D.
Publisher: MAIK Nauka/Interperiodica
ISSN: 1063-7826
Source: Semiconductors, Vol.45, Iss.6, 2011-06, pp. : 753-760
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