Effects of stirring on the bulk etch rate of LR 115 detector

Author: Yip C.W.Y.   Ho J.P.Y.   Koo V.S.Y.   Nikezic D.   Yu K.N.  

Publisher: Elsevier

ISSN: 1350-4487

Source: Radiation Measurements, Vol.37, Iss.3, 2003-06, pp. : 197-200

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Abstract