Influence of back-gate stress on the back-gate threshold voltage of a LOCOS-isolated SOIMOSFET

Author: Bo Mei   Jinshun Bi   Duoli Li   Sinan Liu   Zhengsheng Han  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.33, Iss.2, 2012-02, pp. : 24002-24006

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Abstract