Investigations of Charge Migration and Charge Trapping in Fatigued Organic Photoconductors

Author： Tokarski Zbigniew Ahn Yong-Jin Jung Soo-Yong

Publisher： Society for Imaging Science and Technology

ISSN： 1943-3522

Source： Journal of Imaging Science and Technology, Vol.56, Iss.6, 2012-11, pp. : 60501-1

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