Author: Kawagishi T. Kato A. Hoshi Y. Kawakatsu H.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.91, Iss.1, 2002-05, pp. : 37-48
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Thermomechanical noise of a free v-shaped cantilever for atomic-force microscopy
By Stark R.W. Drobek T. Heckl W.M.
Ultramicroscopy, Vol. 86, Iss. 1, 2001-01 ,pp. :
Wear of the atomic force microscope tip under light load, studied by atomic force microscopy
Ultramicroscopy, Vol. 60, Iss. 1, 1995-08 ,pp. :
By Ono M. Lange D. Brand O. Hagleitner C. Baltes H.
Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. :
Developments for inverted atomic force microscopy
By Mabry J.C. Yau T. Yap H. Green J.-B.D.
Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. :
Atomic force microscopy in analytical biotechnology
By Allen S. Davies M.C. Roberts C.J. Tendler S.J.B. Williams P.M.
Trends in Biotechnology, Vol. 15, Iss. 3, 1997-03 ,pp. :