Bias-induced forces in conducting atomic force microscopy and contact charging of organic monolayers

Author： Cui X.D. Zarate X. Tomfohr J. Primak A. Moore A.L. Moore T.A. Gust D. Harris G. Sankey O.F. Lindsay S.M.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.92, Iss.2, 2002-07, pp. : 67-76

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