A new method for the determination of the wave aberration function for high resolution TEM - 1. Measurement of the symmetric aberrations

Author： Meyer R.R.   Kirkland A.I.   Saxton W.O.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.92, Iss.2, 2002-07, pp. : 89-109

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