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Elsevier

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Assessing Micromechanical Properties of Cells with Atomic Force Microscopy: Importance of the Contact Point

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Current and potential characterization on InAs nanowires by contact-mode atomic force microscopy and Kelvin probe force microscopy

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Effects of relative humidity and applied force on atomic force microscopy images of the filamentous phage fd

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Bias-induced forces in conducting atomic force microscopy and contact charging of organic monolayers

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