Author: Kim J. D. Nam K. S. Koo J. G.
Publisher: Taylor & Francis Ltd
ISSN: 1362-3060
Source: International Journal of Electronics, Vol.81, Iss.3, 1996-09, pp. : 285-290
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Modeling Feedback Bridging Faults with Non-Zero Resistance
By Polian Ilia
Journal of Electronic Testing, Vol. 21, Iss. 1, 2005-02 ,pp. :
Low resistance indium tin oxide contact to n-GaAs nanowires
By Zhang J Chia A C E LaPierre R R
Semiconductor Science and Technology, Vol. 29, Iss. 5, 2014-05 ,pp. :