Characterization of nanostructured copper films for electromagnetic shield

Author: Desideri Daniele   Maschio Alvise   Bolzan Marco   Natali Marco   Spolaore Monica  

Publisher: Emerald Group Publishing Ltd

ISSN: 0332-1649

Source: COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.31, Iss.4, 2012-07, pp. : 1122-1132

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