Effects of scaling on the impact ionization and sub-threshold current in submicron MOSFETs

Author: Jharia Bhavana   Sarkar S.   Agarwal R.P.  

Publisher: Emerald Group Publishing Ltd

ISSN: 1356-5362

Source: Microelectronics International, Vol.25, Iss.1, 2007-12, pp. : 41-45

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