Analytical modeling for the estimation of leakage current and subthreshold swing factor of nanoscale double gate FinFET device

Author: Raj Balwinder   Saxena A.K.   Dasgupta S.  

Publisher: Emerald Group Publishing Ltd

ISSN: 1356-5362

Source: Microelectronics International, Vol.26, Iss.1, 2009-01, pp. : 53-63

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