Analytical modeling of drain current and RF performance for double-gate fully depleted nanoscale SOI MOSFETs

Author： Sharma Rajiv   Pandey Sujata   Shail Bala Jain  

Publisher： IOP Publishing

ISSN： 1674-4926

Source： Journal of Semiconductors, Vol.33, Iss.2, 2012-02, pp. : 24001-24008

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