Effects of the polarity of high-electric field stressing on power VDMOSFETs parameters

Author： Bitar R. El   Salloum G.   Nsouli B.  

Publisher： Emerald Group Publishing Ltd

ISSN： 1356-5362

Source： Microelectronics International, Vol.27, Iss.1, 2010-01, pp. : 17-20

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