Atomic structure observation of silicon carbide using HRTEM

By Takuma E.   Ichinose1 H.   Chen2 F-R.  

Journal of Electron Microscopy, Vol. 51, Iss. 5, 2002-10 ,pp. : 297-302

Oxford University Press

Access to resources Recommend Favorite

Atomic Structure of a Defect Colony in Silicon Introduced during Neutron Irradiation in the JOYO Reactor

By Ohno Yutaka   Oshima Ryuichiro  

Journal of Electron Microscopy, Vol. 45, Iss. 5, 1996-10 ,pp. : 380-387

Oxford University Press

Access to resources Recommend Favorite

High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface

By Liu J.   Takeguchi M.   Tanaka M.   Yasuda H.   Furuya K.  

Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 541-544

Oxford University Press

Access to resources Recommend Favorite

High-resolution three-dimensional scanning transmission electron microscopy characterization of oxidenitrideoxide layer interfaces in Si-based semiconductors using computed tomography

By Sadayama Shoji   Sekiguchi Hiromi   Bright Alexander   Suzuki Naohisa   Yamada Kazuhiro   Kaneko Kenji  

Journal of Electron Microscopy, Vol. 60, Iss. 3, 2011-06 ,pp. : 243-251

Oxford University Press

Access to resources Recommend Favorite

Vortex beams for atomic resolution dichroism

By Idrobo Juan C.   Pennycook Stephen J.  

Journal of Electron Microscopy, Vol. 60, Iss. 5, 2011-10 ,pp. : 295-300

Oxford University Press

Access to resources Recommend Favorite