Imaging of Transition Radiation from Thin Films on a Silicon Substrate Using a Light Detection System Combined with TEM

Author： Yamamoto Naoki   Toda Akio   Axaya Katsuhiro  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.45, Iss.1, 1996-02, pp. : 64-72

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