Electron holography study for two-dimensional dopant profile measurement with specimens prepared by backside ion milling

By Yoo Jung Ho   Yang Jun-Mo   Ulugbek Shaislamov   Ahn Chi Won   Hwang Wook-Jung   Park Joong Keun   Park Chul Min   Hong Seung Bum   Kim Joong Jung   Shindo Daisuke  

Journal of Electron Microscopy, Vol. 57, Iss. 1, 2008-01 ,pp. : 13-18

Oxford University Press

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Removing focused ion-beam damages on transmission electron microscopy specimens by using a plasma cleaner

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Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 23-26

Oxford University Press

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SEM observation of the insect prepared by microwave irradiation

By Koga Daisuke  

Journal of Electron Microscopy, Vol. 52, Iss. 5, 2003-11 ,pp. : 477-484

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Observation of Flower Bud Formation by a Simple Direct SEM Viewing Method

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Focused ion beam fabrication of field-ion microscope specimens from mechanically milled pearlitic steel powder

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