Short-Range Ordered Structure of Ga 0.47 In 0.53 As Studied by Energy-Filtered Electron Diffraction and HREM

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Oxford University Press

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Structure analysis of inorganic crystals by energy-filtered precession electron diffraction

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Journal of Electron Microscopy, Vol. 59, Iss. 4, 2010-08 ,pp. : 273-283

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First application of Cc -corrected imaging for high-resolution and energy-filtered TEM

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Journal of Electron Microscopy, Vol. 58, Iss. 3, 2009-06 ,pp. : 147-155

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Note. Quantitative analysis of a high-resolution electron microscopy image of WO 3 block structure with a residual index

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Journal of Electron Microscopy, Vol. 46, Iss. 6, 1998-01 ,pp. : 473-476

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High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface

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