High-resolution transmission electron microscopy and electron energy-loss spectroscopy study of polycrystalline-Si/ZrO 2 /SiO 2 /Si metal-oxide-semiconductor structures

By Yang Jun-Mo   Kim Joong Jung   Kim Kyung-Seob   Lee Wan-Gyu   Kawasaki Masahiro  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 1-5

Oxford University Press

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In situ observation of Pt nanoparticles on graphene layers under high temperature using aberration-corrected transmission electron microscopy

By Hashimoto Ayako   Takeguchi Masaki  

Journal of Electron Microscopy, Vol. 61, Iss. 6, 2012-12 ,pp. : 409-413

Oxford University Press

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Direct imaging of lithium atoms in LiV 2 O 4 by spherical aberration-corrected electron microscopy

By Oshima Yoshifumi   Sawada Hidetaka   Hosokawa Fumio   Okunishi Eiji   Kaneyama Toshikatsu   Kondo Yukihito   Niitaka Seiji   Takagi Hidenori   Tanishiro Yasumasa   Takayanagi Kunio  

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 457-461

Oxford University Press

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high resolution electron microscopy, scanning transmission electron microscopy, spherical aberration, aberration correction, Ronchigram analysis

By Dellby N   Krivanek L  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 177-185

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High-resolution three-dimensional scanning transmission electron microscopy characterization of oxidenitrideoxide layer interfaces in Si-based semiconductors using computed tomography

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Journal of Electron Microscopy, Vol. 60, Iss. 3, 2011-06 ,pp. : 243-251

Oxford University Press

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