High-resolution low-dose scanning transmission electron microscopy

By Buban James P.   Ramasse Quentin   Gipson Bryant   Browning Nigel D.   Stahlberg Henning  

Journal of Electron Microscopy, Vol. 59, Iss. 2, 2010-04 ,pp. : 103-112

Oxford University Press

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Energy‐filtered electron diffraction and high‐resolution electron microscopy on short‐range ordered structure in GaAs 0.5 Sb 0.5

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Journal of Electron Microscopy, Vol. 51, Iss. 1, 2002-03 ,pp. : 29-34

Oxford University Press

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High-resolution three-dimensional scanning transmission electron microscopy characterization of oxidenitrideoxide layer interfaces in Si-based semiconductors using computed tomography

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Journal of Electron Microscopy, Vol. 60, Iss. 3, 2011-06 ,pp. : 243-251

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Seto Award 1996. High-resolution transmission electron microscopy of high-T c oxycarbonate superconductors

By Matsui Y.  

Journal of Electron Microscopy, Vol. 46, Iss. 2, 1997-01 ,pp. : 135-150

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high resolution electron microscopy, scanning transmission electron microscopy, spherical aberration, aberration correction, Ronchigram analysis

By Dellby N   Krivanek L  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 177-185

Oxford University Press

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