Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique

By Choi Pyuck-Pa   Kwon Young-Soon   Kim Ji-Soon   Al-Kassab Tala’at  

Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 43-49

Oxford University Press

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Fabrication of a TEM sample of ion-irradiated material using focused ion beam microprocessing and low-energy Ar ion milling

By Jin Hyung-Ha   Shin Chansun   Kwon Junhyun  

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 463-468

Oxford University Press

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Removing focused ion-beam damages on transmission electron microscopy specimens by using a plasma cleaner

By Hata Satoshi   Sosiati Harini   Kuwano Noriyuki   Itakura Masaru   Nakano Takayoshi   Umakoshi Yukichi  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 23-26

Oxford University Press

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Focused ion beam preparation techniques dedicated for the fabrication of TEM lamellae of fibre-reinforced composites

By Mucha Herbert  

Journal of Electron Microscopy, Vol. 54, Iss. 1, 2005-01 ,pp. : 43-49

Oxford University Press

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A review of focused ion beam technology and its applications in transmission electron microscopy

By Sugiyama Masaaki   Sigesato Genichi  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 527-536

Oxford University Press

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