Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system

By Wang Zhouguang   Kato Takeharu   Hirayama Tsukasa  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 489-491

Oxford University Press

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Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient

By Hata Satoshi  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 537-540

Oxford University Press

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A preparation method of sections of fine particles and cross-sectional transmission electron microscopy of Ni powder

By Kawasaki M.  

Journal of Electron Microscopy, Vol. 46, Iss. 4, 1997-01 ,pp. : 293-303

Oxford University Press

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A novel technique to eliminate cross-contamination when making wells on slides for rabies diagnosis

By Wong A.J.   Constantine D.G.   Armstrong O.   Wong W.Y.   Comb J.C.  

Journal of Virological Methods, Vol. 115, Iss. 2, 2004-02 ,pp. : 117-122

Elsevier

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Genomic characterization of thermophilic Geobacillus species isolated from the deepest sea mud of the Mariana Trench

By Takami Hideto   Nishi Shinro   Lu Jei   Shimamura Shigeru   Takaki Yoshihiro  

Extremophiles, Vol. 8, Iss. 5, 2004-10 ,pp. : 351-356

Springer Publishing Company

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