Energy‐filtered electron diffraction and high‐resolution electron microscopy on short‐range ordered structure in GaAs 0.5 Sb 0.5

By Shindo* Daisuke   Ikematsu1 Yoichi   Lee Chang‐Woo   Suzuki2 Tohru   Ichihashi3 Toshinari  

Journal of Electron Microscopy, Vol. 51, Iss. 1, 2002-03 ,pp. : 29-34

Oxford University Press

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Structure analysis of inorganic crystals by energy-filtered precession electron diffraction

By Kim Jin-Gyu   Song Kyung   Kwon Kihyun   Hong Kimin   Kim Youn-Joong  

Journal of Electron Microscopy, Vol. 59, Iss. 4, 2010-08 ,pp. : 273-283

Oxford University Press

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Attainable Resolution of Energy-Selecting Image Using High-Voltage Electron Microscope

By Kurata Hiroki   Moriguchi Sakumi   Isoda Seiji   Kobayashi Takashi  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 79-84

Oxford University Press

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Short-Range Ordered Structure of Ga 0.47 In 0.53 As Studied by Energy-Filtered Electron Diffraction and HREM

By Shindo Daisuke   Gomyo Akiko   Zuo Jianm-Min   Spence John C. H.  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 99-104

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Characterization of Co 25 Ag 75 and (Co 90 Al 10 ) 28 Ag 72 granular films by electron diffraction, high-resolution transmission electron microscopy and electron spectroscopic imaging

By Öksüzoglu1 *- R.M.   Weirich T.E.   Fuess H.  

Journal of Electron Microscopy, Vol. 52, Iss. 2, 2003-05 ,pp. : 91-100

Oxford University Press

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