Dark-field transmission electron microscopy for a tilt series of ordering alloys: toward electron tomography

Author： Kimura Kousuke Hata Satoshi Matsumura Syo Horiuchi Takao

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.54, Iss.4, 2005-08, pp. : 373-377

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems

By Lu Kangbo Sourty Erwan Loos Joachim

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 531-531

Oxford University Press

Access to resources Recommend Favorite

decagonal quasicrystal, high-angle annular dark-field imaging, Z-contrast imaging, convergent-beam electron diffraction

By Saitoh K

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 197-203

Oxford University Press

Access to resources Recommend Favorite

Advances in energy-filtering transmission electron microscopy

By Sigle W. Zern A. Hahn K. Eigenthaler U. Rühle M.

Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 509-515

Oxford University Press

Access to resources Recommend Favorite

Chemical Mapping by Energy-Filtering Transmission Electron Microscopy

By Kurata Hiroki Isoda Seiji Kobayashi Takashi

Journal of Electron Microscopy, Vol. 45, Iss. 4, 1996-08 ,pp. : 317-320

Oxford University Press

Access to resources Recommend Favorite

High-resolution three-dimensional scanning transmission electron microscopy characterization of oxidenitrideoxide layer interfaces in Si-based semiconductors using computed tomography

By Sadayama Shoji Sekiguchi Hiromi Bright Alexander Suzuki Naohisa Yamada Kazuhiro Kaneko Kenji

Journal of Electron Microscopy, Vol. 60, Iss. 3, 2011-06 ,pp. : 243-251

Oxford University Press

Access to resources Recommend Favorite