Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy

By Ishitani Tohru   Kamiya Chisato   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 54, Iss. 2, 2005-04 ,pp. : 85-97

Oxford University Press

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Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy

By Ishitani Tohru   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 53, Iss. 3, 2004-06 ,pp. : 245-255

Oxford University Press

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Contrast-to-gradient method for the evaluation of image resolution in scanning electron microscopy

By Ishitani T.   Sato M.  

Journal of Electron Microscopy, Vol. 51, Iss. 6, 2002-11 ,pp. : 369-382

Oxford University Press

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Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy

By Ishitani Tohru   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 55, Iss. 5, 2006-10 ,pp. : 253-260

Oxford University Press

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atomic-resolution Z-contrast scanning transmission electron microscopy, icosahedral quasicrystals, intermetallic compound

By Abe E   Takakura H   Tsai AP  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 187-195

Oxford University Press

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