A preparation method of sections of fine particles and cross-sectional transmission electron microscopy of Ni powder

By Kawasaki M.  

Journal of Electron Microscopy, Vol. 46, Iss. 4, 1997-01 ,pp. : 293-303

Oxford University Press

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High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface

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Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 541-544

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Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy

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Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 27-30

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Back-etch method for plan view transmission electron microscopy sample preparation of optically opaque films

By Yao Bo   Coffey Kevin R.  

Journal of Electron Microscopy, Vol. 57, Iss. 2, 2008-04 ,pp. : 47-52

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Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

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Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

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