Strain analysis of arsenic-doped silicon using CBED rocking curves of low-order reflections

By Tsuda Kenji   Mitsuishi Hajime   Terauchi Masami   Kawamura Kazuo  

Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 57-61

Oxford University Press

Access to resources Recommend Favorite

The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination

By Chuvilin Andrey  

Journal of Electron Microscopy, Vol. 53, Iss. 3, 2004-06 ,pp. : 237-244

Oxford University Press

Access to resources Recommend Favorite

On the origin of HOLZ lines splitting near interfaces: multislice simulation of CBED patterns

By Chuvilin Andrey   Kaiser Ute   de Robillard Quentin   Engelmann Hans-Jürgen  

Journal of Electron Microscopy, Vol. 54, Iss. 6, 2005-12 ,pp. : 515-517

Oxford University Press

Access to resources Recommend Favorite

Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns

By Saitoh Koh   Yasuda Yoshifumi   Hamabe Maiko   Tanaka Nobuo  

Journal of Electron Microscopy, Vol. 59, Iss. 5, 2010-10 ,pp. : 367-378

Oxford University Press

Access to resources Recommend Favorite

Estimation of contaminant depletion in unsaturated soils using a reduced-order biodegradation model and carbon dioxide measurement

By Schoefs O.  

Applied Microbiology and Biotechnology, Vol. 64, Iss. 1, 2004-03 ,pp. : 53-61

Springer Publishing Company

Access to resources Recommend Favorite