Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique

By Choi Pyuck-Pa   Kwon Young-Soon   Kim Ji-Soon   Al-Kassab Tala’at  

Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 43-49

Oxford University Press

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Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

By Sasaki Hirokazu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

Oxford University Press

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Specimen preparation of porous Au for transmission electron microscopy using cryo ion-milling

By Tanabe Toyokazu  

Journal of Electron Microscopy, Vol. 60, Iss. 1, 2011-02 ,pp. : 35-37

Oxford University Press

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A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples

By Yao Bo   Petrova Rumyana V.   Vanfleet Richard R.   Coffey Kevin R.  

Journal of Electron Microscopy, Vol. 55, Iss. 4, 2006-08 ,pp. : 209-214

Oxford University Press

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Back-etch method for plan view transmission electron microscopy sample preparation of optically opaque films

By Yao Bo   Coffey Kevin R.  

Journal of Electron Microscopy, Vol. 57, Iss. 2, 2008-04 ,pp. : 47-52

Oxford University Press

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