Energy‐filtered electron diffraction and high‐resolution electron microscopy on short‐range ordered structure in GaAs 0.5 Sb 0.5

By Shindo* Daisuke   Ikematsu1 Yoichi   Lee Chang‐Woo   Suzuki2 Tohru   Ichihashi3 Toshinari  

Journal of Electron Microscopy, Vol. 51, Iss. 1, 2002-03 ,pp. : 29-34

Oxford University Press

Access to resources Recommend Favorite

Short-Range Ordered Structure of Ga 0.47 In 0.53 As Studied by Energy-Filtered Electron Diffraction and HREM

By Shindo Daisuke   Gomyo Akiko   Zuo Jianm-Min   Spence John C. H.  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 99-104

Oxford University Press

Access to resources Recommend Favorite

Evaluation of a 2k CCD camera with an epitaxially grown CsI scintillator for recording energy-filtered electron cryo-micrographs

By Yasunaga Takuo   Wakabayashi Takeyuki  

Journal of Electron Microscopy, Vol. 57, Iss. 3, 2008-06 ,pp. : 101-112

Oxford University Press

Access to resources Recommend Favorite

First application of Cc -corrected imaging for high-resolution and energy-filtered TEM

By Kabius Bernd   Hartel Peter   Haider Maximilian   Mller Heiko   Uhlemann Stephan   Loebau Ulrich   Zach Joachim   Rose Harald  

Journal of Electron Microscopy, Vol. 58, Iss. 3, 2009-06 ,pp. : 147-155

Oxford University Press

Access to resources Recommend Favorite

Evaluation of imaging plates as recording medium for images of negatively stained single particles and electron diffraction patterns of two-dimensional crystals

By Li Zongli   Hite Richard K.   Cheng Yifan   Walz Thomas  

Journal of Electron Microscopy, Vol. 59, Iss. 1, 2010-02 ,pp. : 53-63

Oxford University Press

Access to resources Recommend Favorite